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STM32L151XE Arkusz danych(PDF) 107 Page - STMicroelectronics |
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STM32L151XE Arkusz danych(HTML) 107 Page - STMicroelectronics |
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107 / 136 page ![]() DS10002 Rev 10 107/136 STM32L151xE STM32L152xE Electrical characteristics 114 Figure 29. Maximum dynamic current consumption on VREF+ supply pin during ADC conversion General PCB design guidelines Power supply decoupling must be performed as shown in Figure 11. The applicable procedure depends on whether VREF+ is connected to VDDA or not. The 100 nF capacitors must be ceramic (good quality). They must be placed as close as possible to the chip. ADC clock Sampling (n cycles) Conversion (12 cycles) Iref+ 300µA 700µA MS36686V1 Table 57. Maximum source impedance RAIN max(1) Ts (µs) RAIN max (kΩ) Ts (cycles) fADC=16 MHz(2) Multiplexed channels Direct channels 2.4 V < VDDA < 3.6 V 1.8 V < VDDA < 2.4 V 2.4 V < VDDA < 3.6 V 1.8 V < VDDA < 2.4 V 0.25 Not allowed Not allowed 0.7 Not allowed 4 0.5625 0.8 Not allowed 2.0 1.0 9 1 2.0 0.8 4.0 3.0 16 1.5 3.0 1.8 6.0 4.5 24 3 6.8 4.0 15.0 10.0 48 6 15.0 10.0 30.0 20.0 96 12 32.0 25.0 50.0 40.0 192 24 50.0 50.0 50.0 50.0 384 1. Guaranteed by design. 2. Number of samples calculated for fADC = 16 MHz. For fADC = 8 and 4 MHz the number of sampling cycles can be reduced with respect to the minimum sampling time Ts (µs), |
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