Features
• Devices QML Qualified in Accordance with MIL-PRF-38535
• Detailed Electrical and Screening Requirements are
Contained in SMD# 5962-96711 and Intersil’ QM Plan
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose >300K RAD (Si)
• Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/
Bit/Day (Typ)
• SEU LET Threshold>100 MEV-cm2/mg
• Dose Rate Upset>1011 RAD (Si)/s, 20ns Pulse
• Dose Rate Survivability>1012 RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range-55oC to +125oC
• Significant Power Reduction Compared to ALSTTL
Logic
• DC Operating Voltage Range 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current  1A at VOL, VOH
• Fast Propagation Delay37ns (Max), 24ns (Typ)

Description
The Intersil ACS630MS is a Radiation Hardened 16-bit parallel
error detection and correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data
word. The check word is stored with the data word during a
memory write cycle; during a memory read cycle a 22-bit word is
taken form memory and checked for errors. Single bit errors in
the data words are flagged and corrected. Single bit errors in
check words are flagged but not corrected. The position of the
incorrect bit is pinpointed, in both cases, by the 6-bit error
syndrome code which is output during the error correction cycle.
The ACS630MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of a
radiation hardened, high-speed, CMOS/SOS Logic Family.
The ACS630MS is supplied in a 28 lead Ceramic Flatpack (K
suffix) or a 28 Lead Ceramic Dual-In-Line Package (D suffix).