Zakładka z wyszukiwarką danych komponentów
  Polish  ▼
ALLDATASHEET.PL

X  

SCANSTA101 Arkusz danych (PDF) - Texas Instruments

SCANSTA101 Datasheet PDF - Texas Instruments
Numer części SCANSTA101
Pobierz  SCANSTA101 Pobierz
Rozmiar pliku   923.0 Kbytes
Page   42 Pages
Producent  TI2 [Texas Instruments]
Strona internetowa  https://www.ti.com
Logo TI2 - Texas Instruments
Szczegółowy opis SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master

SCANSTA101 Datasheet (PDF)

Go To PDF Page Pobierz Arkusz danych
SCANSTA101 Datasheet PDF - Texas Instruments

Numer części SCANSTA101
Pobierz  SCANSTA101 Click to download

Rozmiar pliku   923.0 Kbytes
Page   42 Pages
Producent  TI2 [Texas Instruments]
Strona internetowa  https://www.ti.com
Logo TI2 - Texas Instruments
Szczegółowy opis SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master

SCANSTA101 Arkusz danych (HTML) - Texas Instruments


SCANSTA101 Szczegóły Produktu

1FEATURES
2• Compatible with IEEE Std. 1149.1 (JTAG) Test
Access Port and Boundary Scan Architecture
• Supported by Texas Instruments' SCAN Ease
(SCAN Embedded Application Software
Enabler) Software Rev 2.0
• Uses Generic, Asynchronous Processor
Interface; Compatible with a Wide Range of
Processors and Processor Clock (PCLK)
Frequencies
• 16-Bit Data Interface (IP Scalable to 32-bit)
• 2k x 32 Bit Dual-Port Memory
• Load-on-the-Fly (LotF) and Preloaded Vector
Operating Modes Supported
• On-Board Sequencer Allows Multi-Vector
Operations such as those Required to Load
Data Into an FPGA
• On-Board Compares Support Test Data In
(TDI) Validation Against Preloaded Expected
Data
• 32-Bit Linear Feedback Shift Register (LFSR)
at the Test Data In (TDI) Port for Signature
Compression
• State, Shift, and BIST Macros Allow
Predetermined Test Mode Select (TMS)
Sequences to be Utilized
• Operates at 3.3 V Supply Voltages with 5 V
Tolerant I/O
• Outputs Support Power-Down TRI-STATE
Mode.

DESCRIPTION
The SCANSTA101 is designed to function as a test
master for an IEEE 1149.1 boundary scan test
system. It is suitable for use in embedded IEEE
1149.1 applications and as a component in a stand-
alone boundary scan tester.
The SCANSTA101 is an enhanced version of, and a
replacement for, the SCANPSC100. The
SCANSTA101 supports the IEEE 1149.1 Test Access
Port (TAP) standard and the IEEE 1532 standard for
in-system configuration of programmable devices.
The SCANSTA101 improves test vector throughput
and reduces software overhead in the system
processor. The SCANSTA101 presents a simple,
register-based interface to the system processor.
Texas Instruments provides C-language source code
which can be included in the embedded system
software. The combination of the SCANSTA101 and
its support software comprises a simple API for
boundary scan operations.
The interface from the SCANSTA101 to the system
processor is implemented by reading and writing
registers, some of which map to locations in the
SCANSTA101 memory. Hardware handshaking and
interrupt lines are provided as part of the processor
interface.
The SCANSTA101 is available as a stand-alone
device packaged in a 49-pin NFBGA package. It is
also available as an IP macro for synthesis in programmable logic devices.




Podobny numer części - SCANSTA101

ProducentNumer częściArkusz danychSzczegółowy opis
logo
National Semiconductor ...
SCANSTA101 NSC-SCANSTA101 Datasheet
403Kb / 31P
Low Voltage IEEE 1149.1 STA Master
logo
Texas Instruments
SCANSTA101 TI1-SCANSTA101 Datasheet
1Mb / 39P
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
SCANSTA101SM TI1-SCANSTA101SM Datasheet
1Mb / 39P
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
SCANSTA101SM/NOPB TI1-SCANSTA101SM/NOPB Datasheet
1Mb / 39P
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
SCANSTA101SMX TI1-SCANSTA101SMX Datasheet
1Mb / 39P
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
More results


Podobny opis - SCANSTA101

ProducentNumer częściArkusz danychSzczegółowy opis
logo
National Semiconductor ...
SCAN16512 NSC-SCAN16512 Datasheet
160Kb / 10P
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs
SCANSTA476 NSC-SCANSTA476 Datasheet
502Kb / 7P
Eight Input IEEE 1149.1 Analog Voltage Monitor
SCANSTA101 NSC-SCANSTA101 Datasheet
403Kb / 31P
Low Voltage IEEE 1149.1 STA Master
logo
Texas Instruments
SN54LVT8980A TI-SN54LVT8980A Datasheet
575Kb / 35P
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTER WITH 8-BIT GENERIC HOST INTERFACES
logo
National Semiconductor ...
SCANSTA476_0508 NSC-SCANSTA476_0508 Datasheet
501Kb / 7P
Eight Input IEEE 1149.1 Analog Voltage Monitor
logo
Texas Instruments
SCAN16512A TI1-SCAN16512A Datasheet
292Kb / 14P
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs
SCANSTA101 TI1-SCANSTA101_13 Datasheet
1Mb / 39P
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
SCANSTA476 TI1-SCANSTA476 Datasheet
739Kb / 12P
SCANSTA476 Eight Input IEEE 1149.1 Analog Voltage Monitor
logo
Keysight Technologies
N8817A KEYSIGHT-N8817A Datasheet
8Mb / 8P
JTAG (IEEE 1149.1) Protocol
logo
National Semiconductor ...
SCANSTA101 NSC-SCANSTA101_06 Datasheet
641Kb / 32P
Low Voltage IEEE 1149.1 STA Master
More results



Link URL



Czy Alldatasheet okazała się pomocna?  [ DONATE ] 

O Alldatasheet   |   Reklama   |   Kontakt   |   Polityka prywatności   |   Link do karty katalogowej    |   Linki   |   Lista producentów
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com