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ADL5611ARKZ-R7 Arkusz danych(PDF) 14 Page - Analog Devices

Numer części ADL5611ARKZ-R7
Szczegółowy opis  RF/IF Gain Block
PDF  16 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
Logo AD - Analog Devices

ADL5611ARKZ-R7 Arkusz danych(HTML) 14 Page - Analog Devices

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ADL5611
Data Sheet
Rev. B | Page 14 of 16
SOLDERING INFORMATION AND RECOMMENDED
PCB LAND PATTERN
Figure 29 shows the recommended land pattern for the ADL5611.
To minimize thermal impedance, the exposed pad on the
underside of the SOT-89 package is soldered to a ground plane,
along with Pin 2. If multiple ground layers exist, stitch the layers
together using vias.
Figure 29. Recommended Land Pattern
The land pattern on the ADL5611 evaluation board provides a
measured thermal resistance (θJA) of 52°C/W. To measure θJA,
the temperature at the top of the SOT-89 package is sensed with
an IR temperature gun.
Thermal simulation suggests a junction temperature that is
10°C higher than the top of package temperature. With additional
measurements of the ambient temperature and input/output
power, θJA can be determined.
W-CDMA ACPR PERFORMANCE
Figure 30 shows a plot of the adjacent channel power ratio
(ACPR) vs. POUT for the ADL5611. The signal type used is a
single wideband code division multiple access (W-CDMA)
carrier (Test Model 1-64) at 2140 MHz. This signal is generated
by a very low ACPR source. ACPR is measured at the output by
a high dynamic range spectrum analyzer that incorporates an
instrument noise correction function.
Figure 30. ACPR vs. POUT, Single W-CDMA Carrier (Test Model 1-64)
at 2140 MHz
The ADL5611 achieves an ACPR of −79 dBc at an output power
level of −5 dBm, at which point the device noise and not distortion
begins to dominate the power in the adjacent channels. At an
output power level of 5 dBm, ACPR is still very low at −62 dBc.
3.00mm
3.48mm
1.80mm
5.37mm
0.20mm
0.762mm
0.635mm
0.62mm
0.86mm
0.86mm
1.50mm
1.27mm
0
–90
–80
–70
–60
–50
–40
–30
–20
–10
–20
–15
–10
–5
0
10
5
POUT (dBm)



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