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STB11NB40 Arkusz danych(PDF) 4 Page - STMicroelectronics |
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STB11NB40 Arkusz danych(HTML) 4 Page - STMicroelectronics |
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4 / 11 page ![]() STB11NB40/STB11NB40-1 4/11 Table 11. Source Drain Diode Note: 1. Pulse width limited by safe operating area 2. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 % Figure 3. Safe Operating Area Figure 4. Thermal Impedance Figure 5. Output Characteristics Figure 6. Transfer Characteristics Symbol Parameter Test Conditions Min. Typ. Max. Unit ISD Source-drain Current 10.7 A ISDM (1) Source-drain Current (pulsed) 42.8 A VSD (2) Forward On Voltage ISD = 10.7 A; VGS = 0 1.6 V trr Reverse Recovery Time ISD = 10.7 A; di/dt = 100 A/µs 400 ns Qrr Reverse RecoveryCharge VDD = 100 V; Tj = 150 °C (see test circuit, Figure 18) 3.4 µC IRRAM Reverse RecoveryCharge 17 A |
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