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MCP23008 Arkusz danych(PDF) 21 Page - Microchip Technology |
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MCP23008 Arkusz danych(HTML) 21 Page - Microchip Technology |
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21 / 40 page ![]() © 2005 Microchip Technology Inc. DS21919B-page 21 MCP23008/MCP23S08 2.0 ELECTRICAL CHARACTERISTICS Absolute Maximum Ratings † Ambient temperature under bias............................................................................................................ .-40°C to +125°C Storage temperature .............................................................................................................................. -65°C to +150°C Voltage on VDD with respect to VSS ......................................................................................................... -0.3V to +5.5V Voltage on all other pins with respect to VSS (except VDD)............................................................. -0.6V to (VDD + 0.6V) Total power dissipation (Note) ............................................................................................................................. 700 mW Maximum current out of VSS pin ........................................................................................................................... 150 mA Maximum current into VDD pin .............................................................................................................................. 125 mA Input clamp current, IIK (VI < 0 or VI > VDD) ...................................................................................................................... ±20 mA Output clamp current, IOK (VO < 0 or VO > VDD) .............................................................................................................. ±20 mA Maximum output current sunk by any output pin .................................................................................................... 25 mA Maximum output current sourced by any output pin ...............................................................................................25 mA Note: Power dissipation is calculated as follows: PDIS = VDD x {IDD - ∑ IOH} + ∑ {(VDD-VOH) x IOH} + ∑(VOL x IOL) † NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. |
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