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PUSB3AB4 Arkusz danych(PDF) 7 Page - Nexperia B.V. All rights reserved |
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PUSB3AB4 Arkusz danych(HTML) 7 Page - Nexperia B.V. All rights reserved |
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7 / 12 page ![]() Nexperia PUSB3AB4 ESD protection for ultra high-speed interfaces VCL (V) 0 30 20 10 aaa-023074 10 20 30 IPP (A) 0 Very-Fast Transmission Line Pulse (VF-TLP) = 5 ns Fig. 11. Dynamic resistance with positive clamping; typical values VCL (V) -30 0 -10 -20 aaa-023075 -20 -10 0 IPP (A) -30 Very-Fast Transmission Line Pulse (VF-TLP) = 5 ns Fig. 12. Dynamic resistance with negative clamping; typical values VCL (V) 0 8 6 2 4 aaa-023076 4 2 6 8 IPP (A) 0 IEC 61000-4-5; tp = 8/20 µs; positive pulse Fig. 13. Dynamic resistance with positive clamping; typical values VCL (V) -8 0 -2 -6 -4 aaa-023077 -4 -6 -2 0 IPP (A) -8 IEC 61000-4-5; tp = 8/20 µs; negative pulse Fig. 14. Dynamic resistance with negative clamping; typical values 9. Application information The device is designed to provide high-level ESD protection for high-speed serial data buses such as HDMI, DisplayPort, eSATA and LVDS data lines. Note: When designing the PCB, give careful consideration to impedance matching and signal coupling. Do not connect the signal lines to unlimited current sources like, for example, a battery. Dynamic resistance The device uses an advanced clamping structure showing a negative dynamic resistance. This snap-back behavior strongly reduces the clamping voltage to the system behind the ESD protection during an ESD event. Do not connect unlimited DC current sources to the data lines to avoid keeping the ESD protection device in snap-back state after exceeding breakdown voltage (due to an ESD pulse for instance). PUSB3AB4 All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2019. All rights reserved Product data sheet 10 October 2019 7 / 12 |
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