
3
AHF2812S
TABLE II. Electrical Performance Characteristics - Continued
Test
Symbol
Conditions
-55
°C ≤ T
C
≤ +125°C
VIN = 28 V dc ±5%, CL = 0 unless
otherwise specified
Group A
Subgroups
Device
types
Limits
Unit
Min
Max
Output response to step
transient load changes 6/
VOTLOAD
500 mA to/from 1000 mA
4
01
-300
+300
mV pk
5,6
-450
+450
0 mA to/from 500 mA
4
-500
+500
5,6
-750
+750
Recovery time, step
transient load changes
6/ 7/
TTLOAD
500 mA to/from 1000 mA
4,5,6
01
100
µs
0 mA to 500 mA
4,5,6
01
1500
500 mA to 0 mA
4,5,6
10
ms
Output response to
transient step line changes
VOTLINE
Input step 16 V to/from
40 V dc, IOUT = 1000 mA 4/ 8/
4,5,6
01
1500
mV pk
Recovery time transient
step line changes
TTLINE
Input step 16 V to/from 40 V dc
IOUT = 1000 mA 4/ 7/ 8/
4,5,6
01
800
µs
Turn on overshoot
VTonOS
IOUT = 0 and 1000 mA
4,5,6
01
600
mV pk
Turn on delay
TonD
IOUT = 0 and 1000 mA
9/
4,5,6
01
20
ms
Load fault recovery 4/ 9/
TrLF
4,5,6
01
20
ms
Weight
35
grams
Notes:
1/
Parameter guaranteed by line and load regulation tests.
2/
Bandwidth guaranteed by design. Tested for 20 kHz to 2 MHz.
3/
Capacitive load may be any value from 0 to the maximum limit without compromising dc performance. A capacitive load in excess of the maximum
limit will not disturb loop stability but may interfere with the operation of the load fault detection circuitry, appearing as a short circuit during turn-on.
4/
Parameter shall be tested as part of design characterization and after design or process changes. Thereafter, parameters shall be guaranteed to the
limits specified in Table II.
5/
An overload is that condition with a load in excess of the rated load but less than that necessary to trigger the short circuit protection and is the
condition of maximum power dissipation.
6/
Load step transition time between 2 and 10 microseconds.
7/
Recovery time is measured from the initiation of the transient to where VOUT has returned to within ±1 percent of VOUT at 50 percent load.
8/
Input step transition time between 2 and 10 microseconds.
9/
Turn-on delay time measurement is for either a step application of power at the input or the removal of a ground signal from the inhibit pin (pin 1)
while power is applied to the input
is unlimited.