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LP4065AB6F Arkusz danych(PDF) 4 Page - Lowpower Semiconductor inc

Numer części LP4065AB6F
Szczegółowy opis  800mA Single Chip Li-Ion and Li-Polymer Charger
PDF  8 Pages
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Producent  POWER [Lowpower Semiconductor inc]
Strona internetowa  http://www.lowpowersemi.com
Logo POWER - Lowpower Semiconductor inc

LP4065AB6F Arkusz danych(HTML) 4 Page - Lowpower Semiconductor inc

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LP4065-00
Aug.-2018
Email: marketing@lowpowersemi.com
www.lowpowersemi.com
Page 4 of 8
Preliminary Datasheet
LP4065
Absolute Maximum Ratings
Note 1
Input Voltage to GND ---------------------------------------------------------------------------------------- -0.3V to 28V
BAT Voltage GND ----------------------------------------------------------------------------------------------- - 5V to 7V
Other pin to GND -------------------------------------------------------------------------------------------- -0.3V to 6.5V
Maximum Junction Temperature ---------------------------------------------------------------------------------- 125℃
Maximum Soldering Temperature (at leads, 10 sec) --------------------------------------------------------- 260℃
Operating Junction Temperature Range (TJ) -------------------------------------------------------- -20℃ to 85℃
Storage Temperature ------------------------------------------------------------------------------------ -65℃ to 165℃
Thermal Information
Maximum Power Dissipation ( PD,TA=25°C) --------------------------------------------------------------------- 0.6W
Thermal Resistance (θJA) ---------------------------------------------------------------------------------------- 200℃/W
ESD Susceptibility
HBM(Human Body Mode) --------------------------------------------------------------------------------------------- 2KV
MM(Machine Mode) ---------------------------------------------------------------------------------------------------- 200V
Note 1.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the
specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.



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