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AM29N323D Arkusz danych(PDF) 45 Page - Advanced Micro Devices |
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AM29N323D Arkusz danych(HTML) 45 Page - Advanced Micro Devices |
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45 / 48 page ![]() 44 Am29N323D August 8, 2002 MASK SET REVISION Revision Extended Code (Hex) Major Reason(s) for Change Initial 01 Second Set 01 Fix device to work at industrial temperature. Third Set 00 Fix data polling and burst in erase suspend. Fourth Set 20 Add extra wait state at row end addresses. Fifth Set 21 Eliminate unlock requirement for 12 V operations. Improve 12 V erase. Sixth Set 21 Fix erase suspend issue. |
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