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TLE5041PLUSC Arkusz danych(PDF) 12 Page - Infineon Technologies AG |
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TLE5041PLUSC Arkusz danych(HTML) 12 Page - Infineon Technologies AG |
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12 / 30 page ![]() Ihigh Ilow VDD* Vrel Vhys Vres Vhys = Vrel - Vres *direct on pins TLE5041plusC Functional Description 2.4.2 Calibrated Mode In calibrated mode the output will switch at zero-crossing of the input signal. Oscillations of the Offset DAC are avoided by switching into a low-jitter mode. Signals below a defined threshold d Β Limit do not trigger the current interface to avoid unwanted output switching. Offset determination is done continuously in calibrated mode. The phase shift between input and output signal is no longer determined by the ratio between digital noise constant and signal amplitude. Therefore a sudden change in the phase shift may occur during the transition from uncalibrated to calibrated mode. 2.4.3 Behavior at Magnetic Input Signals Slower than fmag < 1Hz Magnetic changes exceeding dBstartup can cause output switching of the TLE5041plusC even at fmag significantly lower than 1 Hz. Depending on their amplitude edges slower than Δt startup might be detected. If the digital noise constant (dB startup) is not exceeded before Δtstartup a new initial self-calibration is started. In other words dBstartup needs to be exceeded before Δt startup. Output switching strongly depends on signal amplitude and initial phase. 2.4.4 Undervoltage behavior The voltage supply comparator has an integrated hysteresis V hys with the maximum value of the release level Vrel < 4.5V. This determines the minimum required supply voltage VDD of the chip. A minimum hysteresis V hys of 0.7V is implemented thus avoiding a toggling of the output when the supply voltage VDD is modulated due to the additional voltage drop at RM when switching from low to high current level and VDD = 4.5V (designed for use with R M ≤ 75Ω). Figure 7 Undervoltage behavior Data Sheet 12 V 1.2, 2018-01-18 |
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