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74HC08 Arkusz danych(PDF) 8 Page - Shanghai Leiditech Electronic Technology Co., Ltd |
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74HC08 Arkusz danych(HTML) 8 Page - Shanghai Leiditech Electronic Technology Co., Ltd |
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8 / 15 page ![]() 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Figure 7. Test circuit for measuring switching times Table 9. Test data Input Load Type VI tr, tf CL Test 74HC08 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT08 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HC08; 74HCT08 Rev : www.leiditech.com 01.06.2015 8/15 |
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