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HM85P03K Arkusz danych(PDF) 2 Page - Shenzhen Huazhimei Semiconductor Co., Ltd |
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HM85P03K Arkusz danych(HTML) 2 Page - Shenzhen Huazhimei Semiconductor Co., Ltd |
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2 / 4 page ![]() HM85P03K -30VDS/±25VGS/85A(ID) P-Channel Enhancement Mode MOSFET Electrical Characteristics of CP Test (TA=25°C unless otherwise noted) Symbol Parameter Test Conditions Min. Typ Max. Unit Static Characteristics BVDSS Drain-Source Breakdown Voltage VGS=0V,ID=-250uA -30 V IDSS Zero Gate Voltage Drain Current VDS=-24V,VGS=0V 1 uA TJ=85°C 10 VGS(th) Gate Threshold Voltage VDS=VGS,ID=-250uA 0.45 0.65 1.5 V IGSS Gate Leakage Current VGS=±25V, VDS=0V ±100 nA RDS(on) Drain-Source On-Resistance VGS=-20V, ID=20A 6 mΩ VGS=-10V, ID=15A 7.6 VGS=-4.5V, ID=10A 12 VSD Diode Forward Voltage ISD=15A,VGS=0V 0.75 1.1 V RG Gate Resistance VGS=0V, VDS=0V, Frequency=1MHz 3 Ω Note: 1: Pulse test ; pulse width ≦ 300ns, duty cycle ≦ 2%. 2: Guaranteed by design, not subject to production testing. Shenzhen H&M Semiconductor Co.Ltd http://www.hmsemi.com |
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