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SCY99080CDWR2G Arkusz danych(PDF) 26 Page - ON Semiconductor |
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SCY99080CDWR2G Arkusz danych(HTML) 26 Page - ON Semiconductor |
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26 / 27 page ![]() DDA002C http://onsemi.com 26 Figure 59. Recommended Layout for DDA002C Device Maximum Substrate Charge Measurements This chapter refers to Qmax parameter measurements. The DDA002C has been connected according to the Figure 60 during Qmax measurements. This connection allows measuring just only the substrate current that flows during the L1 demagnetization. Once the current is integrated one can get maximum charge that can flow to the substrate without causing device malfunction. Measure− ments didn’t show that the Qmax depends on the operating frequency of the device. Measurements have been done for TA = 125°C. Figure 60. Substrate Injection Measurements Schematic Ordering Information DELTA device ON Semiconductor Device Package Shipping[ DDA002C SCY99080CDWR2G SOIC−19WB (Pb−Free) 1000 / Tape & Reel [For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. |
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