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L9679E Arkusz danych(PDF) 77 Page - STMicroelectronics

Numer części L9679E
Szczegółowy opis  Automotive battery cut-off circuit and airbag system expansion IC
PDF  124 Pages
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Producent  STMICROELECTRONICS [STMicroelectronics]
Strona internetowa  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9679E Arkusz danych(HTML) 77 Page - STMicroelectronics

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Figure 18. High-level loop diagnostic flow 1
Low level diagnostic is selected (bit 15
of LPDIAGREQ is low) OR an invalid
high level diagnostic is selected OR we
are in DEP_ENABLED state
Leakage test time elapsed
Leakage test time elapsed
SBL flag is asserted if STG
is no more present
AND (FET test is selected)
AND NO leakage is present
Leakage test time elapsed
AND ((LEAKAGE test) OR
(SBL and no leakage is
present) OR (FET test and
leakage is present))
Latch STB, STG flags
FP = 1 if FET test is selected
VRCM (check time elapsed
AND ((VRCM, CHECK test)
is selected OR VRCM fails)
VRCM (check time elapsed
AND (LEAKAGE OR SBL
OR FET test is selected)
AND VRCM NO fails
Latch STB, STG flags
FP = 1 if LEAKAGE or
FET T tests are selected
Leakage test time elapsed
AND (SBL is selected)
AND leakage is present
TIP = 1
Enable VRCM
Disable ISRC and
ISINK
Disable ALL pull
down currents
TIP = 1
TIP = 0
Enable VRCM
Disable ISRC and ISINK
TIP = 1
Enable VRCM
Disable ISRC and ISINK
TIP = 1
Enable VRCM
Disable ISRC and ISINK
Enable HS or LS FET if also
DSTEST = 0111 or 1000
TIP = 1
Off time elapsed AND new
diagnostic request is
VRCM_CHECK OR
LEAKAGE OR SBL OR
FET tests
Off time = 24 µs
New high level diagnostic request
(bit 15 of LPDIAGREQ is high)
Wait enaugh time to
be sure that all
currents and voltages
supplies start in OFF state
FET test timeout = 200µs
Leakage test time = 152/600µs
Leakage test time = 152/600µs
FET TEST
DIAG_OFF
WAIT_OFF
LEAKAGE_TEST_1
LEAKAGE_TEST_2
VRCM check time = 40µs/160µs
VRCM_CHECK
Leakage is detected (due to
the fact that FETs work
properly) OR FET test
timeout elapsed
GADG0903181321PS
L9679E
Diagnostics
DS12485 - Rev 5
page 77/124



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