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183CPHT Arkusz danych(PDF) 5 Page - Vishay Siliconix

Numer części 183CPHT
Szczegółowy opis  Hybrid Conductive Polymer Aluminum Capacitors SMD (Chip), Low Impedance
PDF  6 Pages
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Producent  VISHAY [Vishay Siliconix]
Strona internetowa  http://www.vishay.com
Logo VISHAY - Vishay Siliconix

183CPHT Arkusz danych(HTML) 5 Page - Vishay Siliconix

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183 CPHT
www.vishay.com
Vishay BCcomponents
Revision: 04-Feb-2021
5
Document Number: 28434
For technical questions, contact: aluminumcaps1@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
USEFUL LIFE AND ENDURANCE
Table 7
Note
(1) Identical with endurance for this series
Endurance can be calculated by formula below:
L: estimated lifetime (h)
LTmax.: base lifetime specified at maximum operating temperature with applied DC voltage (h)
Tmax.: rated maximum operating temperature (°C)
Ta: actual ambient temperature (°C)
Table 8
Table 9
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
ENDURANCE TEST AND USEFUL LIFE
SERIES
CASE CODE
USEFUL LIFE
AT 125 °C (h) (1)
ENDURANCE
AT 125 °C (h)
ENDURANCE
AT 105 °C (h)
ENDURANCE
AT 85 °C (h)
ENDURANCE
AT 75 °C (h)
ENDURANCE
AT 65 °C (h)
183 CPHT
0506 to 1010
4000
4000
16 000
64 000
128 000
256 000
MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY
FREQUENCY (Hz)
120
1000
10 000
≥ 100 000
IR MULTIPLIER
0.1
0.3
0.6
1
TEST PROCEDURES AND REQUIREMENTS
TEST
PROCEDURE
(quick reference)
REQUIREMENTS
NAME OF TEST
REFERENCE
Mounting
IEC 60384-25,
subclause 4.3
Shall be performed prior to tests mentioned below;
reflow soldering;
for maximum temperature load
refer to chapter “Mounting”
ΔC/C: ± 5 %
tan
δ ≤ spec. limit
IL2
≤ spec. limit
Endurance
IEC 60384-25 /
CECC 32300,
subclause 4.15
Tamb = 125 °C; UR applied;
for test duration see Table 7
ΔC/C: ± 30 %
tan
δ ≤ 2 x spec. limit
IL2
≤ spec. limit
ESR
≤ 2 x spec. limit
Useful life
CECC 30301,
subclause 1.8.1
Tamb = 125 °C; UR and IR applied;
for test duration see Table 7
ΔC/C: ± 30 %
tan
δ ≤ 2 x spec. limit
IL2
≤ spec. limit
ESR
≤ 2 x spec. limit
Shelf life
(storage at high
temperature)
IEC 60384-25 /
CECC 32300,
subclause 4.16
Tamb = 125 °C; no voltage applied;
1000 h
after test: UR to be applied for 30 min,
24 h to 48 h before measurement
For requirements
see “Endurance test” above
LL
Tmax. x 2
T
max. - Ta
10
-------------------------
=



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