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P0109AL Arkusz danych(PDF) 4 Page - STMicroelectronics |
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P0109AL Arkusz danych(HTML) 4 Page - STMicroelectronics |
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4 / 8 page ![]() Characteristics P0109AL 4/8 DocID030704 Rev 2 Figure 7: Relative variation of dV/dt immunity versus gate-cathode capacitance Figure 8: Surge peak on-state current versus number of cycles Figure 9: Non-repetitive surge peak on-state current for sinusoidal pulse (tp< 10 ms) Figure 10: On-state characteristics Figure 11: Thermal resistance junction to ambient versus copper surface under tab 0 1 2 3 4 5 6 7 0 2 4 6 8 10 C (nF) GK dV/dt[C ] / dV/dt[ = 1k , CGK = 0 F] GK Ω RGK T V = 0.67 xV = 125°C R = 1k D DRM GK j Ω Typical values I (A) TSM 1 1 0 100 1000 0 1 2 3 4 5 6 7 8 Number of cycles Non repetitive T initial = 25°C j Repetitive T = 36 °C amb t = 10ms p One cycle 100.0 10.0 1.0 0.1 0.01 0.10 1.00 10.00 T initial = 25°C j ITSM t (ms) p ITSM(A) |
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