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STM8AF/P6346 Arkusz danych(PDF) 77 Page - STMicroelectronics |
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STM8AF/P6346 Arkusz danych(HTML) 77 Page - STMicroelectronics |
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77 / 95 page  DS12343 Rev 2 77/95 STM8AF6366 Electrical characteristics 93 Static latch-up Two complementary static tests are required on 10 parts to assess the latch-up performance. • A supply overvoltage (applied to each power supply pin) and • A current injection (applied to each input, output and configurable I/O pin) are performed on each sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the application note AN1181. Table 45. Electrical sensitivities Symbol Parameter Conditions Class(1) 1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC specifications, that means when a device belongs to class A it exceeds the JEDEC standard. B class strictly covers all the JEDEC criteria (international standard). LU Static latch-up class TA = 25 °C A TA = 85 °C TA = 125 °C TA = 150 °C |
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