STM32C011F6U6 datasheet(43/94 Pages) STMICROELECTRONICS

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Table 28. Current consumption in Run mode from SRAM at different die temperatures

Symbol

Parameter

Conditions

Typ

Max(1)

1. Evaluated by characterization – Not tested in production.

Unit

General(2)

2. VDD = 3.0 V for values in Typ columns and 3.6 V for values in Max columns, all peripherals disabled.

fHCLK

Fetch

from(3)

3. Code compiled with high optimization for space in SRAM.

°C

105

°C

125

°C

105

°C

125

°C

IDD(Run)

Supply

current in

Run mode

fHCLK = fHSE_bypass

(>32.768 kHz),

fHCLK = fLSE_bypass

(=32.768 kHz)

48 MHz

SRAM

2.80

2.90

2.95

3.05

3.20

3.40

3.70

4.20

32 MHz

1.90

1.95

2.00

2.10

2.20

2.40

2.70

3.20

24 MHz

1.45

1.50

1.55

1.65

1.70

1.90

2.20

2.70

16 MHz

0.990

1.05

1.10

1.20

1.40

1.70

2.20

8 MHz

0.535 0.585 0.635 0.735 0.630 0.860

1.20

1.70

4 MHz

0.305 0.355 0.405 0.505 0.380 0.630 0.900

1.40

2 MHz

0.195 0.240 0.295 0.390 0.250 0.500 0.770

1.30

1 MHz

0.135 0.185 0.235 0.335 0.180 0.430 0.710

1.30

500 kHz

0.110

0.155 0.205 0.305 0.150 0.400 0.670

1.20

125 kHz

0.0865 0.135 0.185 0.285 0.130 0.370 0.650

1.20

32.768 kHz

0.082 0.130 0.180 0.280 0.120 0.370 0.640

1.20

fHCLK = fHSI48/HSIDIV

( > 32 kHz),

fHCLK = fLSI

( = 32 kHz)

48 MHz

3.15

3.20

3.25

3.30

3.50

3.70

3.90

4.40

24 MHz

1.90

1.95

2.00

2.05

2.10

2.30

2.60

3.10

12 MHz

1.30

1.35

1.45

1.50

1.70

1.90

2.40

6 MHz

0.965 0.995

1.05

1.15

1.30

1.60

2.10

3 MHz

0.810 0.835 0.880 0.970 0.900 1.20

1.40

1.90

1.5 MHz

0.730 0.760 0.800 0.890 0.810 1.10

1.30

1.80

750 kHz

0.690 0.720 0.765 0.855 0.770 0.990

1.30

1.80

375 kHz

0.670 0.700 0.745 0.835 0.750 0.970

1.30

1.80

32 kHz

0.082 0.130 0.180 0.280 0.120 0.370 0.640

1.20

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