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JANS2ST3360KT Arkusz danych(PDF) 9 Page - STMicroelectronics |
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JANS2ST3360KT Arkusz danych(HTML) 9 Page - STMicroelectronics |
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9 / 12 page ![]() 6 Other information 6.1 Traceability information Table 9. Date codes Model Date code(1) EM 3yywwN JANS / JANSR PyywwN (2) 1. yy = year, ww = week number, N = lot index in the week. 2. P = country of the wafer fab. 6.2 Documentation Table 10. Documentation provided for each type of product Screening options Radiation level Documentation Engineering model Certificate of conformance. JANS Certificate of conformance. JANSR 100 krad Certificate of conformance. Radiation verification test (RVT) report at 30 / 50 / 70 / 100 krad at 50 rad/s and 0.1 rad/s. JANS2ST3360K Other information DS11305 - Rev 3 page 9/12 |
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