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AS2376 Arkusz danych(PDF) 4 Page - Diodes Incorporated

Numer części AS2376
Szczegółowy opis  LOW-NOISE, LOW QUIESCENT CURRENT, PRECISION OPERATIONAL AMPLIFIER
PDF  13 Pages
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Producent  DIODES [Diodes Incorporated]
Strona internetowa  http://www.diodes.com
Logo DIODES - Diodes Incorporated

AS2376 Arkusz danych(HTML) 4 Page - Diodes Incorporated

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AS2376
Document number: DS45193 Rev. 1 - 2
4 of 13
www.diodes.com
September 2022
© Diodes Incorporated
AS2376
Electrical Characteristics (Limits in standard typeface are for T
A = +25°C, bold typeface applies over -40°C to +125°C
(Note 9), RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2, unless otherwise noted.)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
OFFSET VOLTAGE
VOS
Input offset voltage (Note
10)
-
5
25
μV
Long-term stability (Note 11)
-
-
60
μV
Package level shift (Note 12)
-
-
320
μV
ΔV
OS/ΔT
Input offset voltage versus
temperature
TA = -40°C to +85°C
-
0.26
1.2
μV/°C
TA = -40°C to +125°C
-
0.32
2
μV/°C
PSRR
Input offset voltage versus
power supply
TA = 25°C, VS = 2.2V to 5.5V, VCM < (V
+) – 1.3V
-
5
20
μV/V
TA = -40°C to +125°C,
-
5
-
μV/V
VS = 2.2V to 5.5V, VCM < (V
+) – 1.3V
Channel separation, dc
-
0.5
-
mV/V
INPUT BIAS CURRENT
IB
Input bias current
TA = 25°C
-
0.2
70
pA
TA = –40°C to +125°C
See Typical Characteristics
pA
IOS
Input offset current
-
0.2
70
pA
NOISE
Input voltage noise
f = 0.1Hz to 10Hz
-
0.8
-
μV
PP
en
Input voltage noise density
f = 1kHz
-
9.5
-
nV/
In
Input current noise
f = 1kHz
-
2
-
fA/
INPUT VOLTAGE RANGE
VCM
Common-mode voltage
(V
–) – 0.1
(V
+) + 0.1
V
range
CMRR
Common-mode rejection
ratio
(V
–) < V
CM < (V
+) – 1.3 V
76
90
dB
INPUT CAPACITANCE
Differential
-
6.5
-
pF
Common-mode
-
13
-
pF
OPEN-LOOP GAIN
AOL
Open-loop voltage gain
50mV < VO < (V
+) – 50mV, R
L = 10kΩ
120
134
-
dB
100mV < VO < (V
+) – 100mV, R
L = 2kΩ
120
126
-
dB
FREQUENCY RESPONSE CL = 100 pF, VS = 5.5 V
GBW
Gain-bandwidth product
-
5.5
-
MHz
SR
Slew rate
G = 1
-
2
-
V/μs
tS
Settling time
Settling to 0.1%, 2-V step , G = 1
-
1.6
-
μs
Settling to 0.01%, 2-V step , G = 1
-
2
-
μs
Overload recovery time
VIN × gain > VS
-
0.33
-
μs
Overload recovery time
VIN × gain > VS
-
0.33
-
μs
Notes:
9. Limits over the full temperature are guaranteed by design, but not tested in production.
10. After mounted to PCB, Vos value will be different to spec, the delta value depend on PCB solder stress, the max value is between +/- 80µV, per our
experiment.
11. AS2376Q, the long-term stability is defined as MAX. Vos shift during life HTOL 1000 hours with TA=+125°C (Tj=150°C). This Vos drift with time is not a
linear function of time, and the shift is greater initially and diminishes over time. This parameter is guaranteed by design.
12. After HTSL 2000 hours with TA=+150°C, the Vos drift test condition is TA=+125°C.



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