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HT6256 Arkusz danych(PDF) 6 Page - Honeywell Solid State Electronics Center |
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HT6256 Arkusz danych(HTML) 6 Page - Honeywell Solid State Electronics Center |
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6 / 8 page ![]() HT6256 6 WRITE CYCLE AC TIMING CHARACTERISTICS (1) (1) Test conditions: input switching levels VIL/VIH=0.5V/VDD-0.5V, input rise and fall times <1 ns/V, input and output timing reference levels shown in the Tester AC Timing Characteristics table, capacitive output loading >50 pF, or equivalent capacitive load of 5 pF for TWLQZ. (2) Typical operating conditions: VDD=5.0 V, TA=25 °C. (3) Worst case operation conditions: VDD=4.5 V to 5.5 V, -55 to 225 °C. (4) TAVAVW = TWLWH + TWHWL (5) Guaranteed but not tested. (6) External control of Chip Enable (CE) is available only in other package options. ADDRESS HIGH IMPEDANCE DATA OUT NWE DATA IN DATA VALID TAVAVW NCS CE TAVWH TWLWH TAVWL TWLQZ TDVWH TWHQX TWHDX TSLWH TEHWH TWHAX TWHWL l o b m y Ss r e t e m a r a P) 2 ( l a c i p y T ) 3 ( e s a C t s r o W s t i n U x a M n i M W V A V A T) 4 ( g n i m i T e l c y C e t i r W 0 5s n H W L W Th t d i W e s l u P e t i r W e l b a n E e t i r W 5 4s n H W L S Te m i T e t i r W f o d n E o t t c e l e S p i h C 5 4s n H W V D Te m i T e t i r W f o d n E o t d i l a V a t a D 5 3s n H W V A Te m i T e t i r W f o d n E o t d i l a V s s e r d d A 5 4s n X D H W Te m i T e t i r W f o d n E r e t f a e m i T d l o H a t a D 0s n L W V A Te m i T e t i r W f o t r a t S o t p u t e S d i l a V s s e r d d A 0s n X A H W Te m i T e t i r W f o d n E r e t f a d i l a V s s e r d d A 0s n Z Q L W Te m i T e l b a s i D t u p t u O o t e l b a n E e t i r W 05 1s n X Q H W Te m i T e l b a n E t u p u O o t e l b a s i D e t i r W 5s n L W H W T) 5 ( h t d i W e s l u P e l b a n E e t i r W o t e l b a s i D e t i r W 5s n H W H E T) 6 ( e m i T e t i r W f o d n E o t e l b a n E p i h C 5 4s n |
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