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HT1MOA3S30/E/3 Arkusz danych(PDF) 19 Page - NXP Semiconductors |
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HT1MOA3S30/E/3 Arkusz danych(HTML) 19 Page - NXP Semiconductors |
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19 / 24 page ![]() Specifications of the HT1 MOA3 S30 Rev. 1.1 1997-08-19 Ht1moa3.doc/HS Page 19 of 24 6 Quality Inspection Quality inspection is performed with statistical quality control according to ISO 2859 part 1, with AQL1.0. Optical Properties scratches, encapsulation failures, gold discolouration, delamination according to the reference sample catalogue Geometrical Properies width measured with gauge length measured with gauge overall thickness measured with micrometer at the center of the glob top Electrical Properties operation basic read/write operations Shipment Quantity Packing and Labeling |
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