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AM29SL160C Arkusz danych(PDF) 46 Page - Advanced Micro Devices |
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AM29SL160C Arkusz danych(HTML) 46 Page - Advanced Micro Devices |
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46 / 52 page ![]() 44 Am29SL160C 21635C5 January 23, 2007 D A TA SH EE T AC CHARACTERISTICS Alternate CE# Controlled Erase/Program Operations Notes: 1. Not 100% tested. 2. See “Erase And Programming Performance” on page 46 for more information. Parameter Speed Options JEDEC Std. Description -100 -120 -150 Unit t AVAV t WC Write Cycle Time (Note 1) Min 100 120 150 ns t AVEL t AS Address Setup Time Min 0 ns tELAX tAH Address Hold Time Min 50 60 70 ns tDVEH tDS Data Setup Time Min 50 60 70 ns tEHDX tDH Data Hold Time Min 0 ns t GHEL t GHEL Read Recovery Time Before Write (OE# High to WE# Low) Min 0 ns tWLEL tWS WE# Setup Time Min 0 ns tEHWH tWH WE# Hold Time Min 0 ns tELEH tCP CE# Pulse Width Min 50 60 70 ns tEHEL tCPH CE# Pulse Width High Min 30 ns tWHWH1 tWHWH1 Programming Operation (Notes 1, 2) Byte Typ 10 µs Word Typ 12 Accelerated Program Operation, Byte or Word (Note 2) Typ 8 µs t WHWH2 t WHWH2 Sector Erase Operation (Notes 1, 2) Typ 2 sec |
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