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ESDL2011 Arkusz danych(PDF) 2 Page - ON Semiconductor |
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ESDL2011 Arkusz danych(HTML) 2 Page - ON Semiconductor |
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2 / 7 page ![]() Bi−Directional Surge Protector IPP IPP V I IR IT IT IR VRWM VC VBR VRWM VC VBR ESDL2011 www.onsemi.com 2 ELECTRICAL CHARACTERISTICS (TA = 25C unless otherwise noted) Symbol Parameter IPP Maximum Reverse Peak Pulse Current VC Clamping Voltage @ IPP VRWM Working Peak Reverse Voltage IR Maximum Reverse Leakage Current @ VRWM VBR Breakdown Voltage @ IT IT Test Current *See Application Note AND8308/D for detailed explanations of datasheet parameters. ELECTRICAL CHARACTERISTICS (TA = 25C unless otherwise specified) Parameter Symbol Conditions Min Typ Max Unit Reverse Working Voltage VRWM I/O Pin to GND 1.0 V Breakdown Voltage VBR IT = 1 mA, I/O Pin to GND 1.4 1.65 2.3 V Reverse Leakage Current IR VRWM = 1.0 V 30 500 nA Clamping Voltage (Note 2) VC IEC61000−4−2, 8 kV Contact Figures 1 and 2 V Clamping Voltage 200 ns TLP VC IPP = 4 A IEC61000−4−2 Level 1 Equivalent (2 kV Contact, 4 kV Air) 3.5 4.0 V IPP = 8 A IEC61000−4−2 Level 2 Equivalent (4 kV Contact, 8 kV Air) 4.8 6.0 Reverse Peak Pulse Current per Figure 12 IPP per IEC61000−4−5 (1.2/50 ms), Req = 12 W 3.5 4.5 A Clamping Voltage 1.2/50 ms Waveform per Figure 12 VC IPP = 2.1 A, IEC61000−4−5 (1.2/50 ms), Req = 12 W 2.9 3.5 V Clamping Voltage 1.2/50 ms Waveform per Figure 12 VC IPP = 3.5 A, IEC61000−4−5 (1.2/50 ms), Req = 12 W 3.6 4.0 V Dynamic Resistance (TLP) RDYN I/O Pin to GND (4 A to 8 A, 200 ns TLP) 0.34 0.5 W Junction Capacitance CJ VR = 0 V, f = 1 MHz 0.17 0.20 pF Insertion Loss IL f = 5 GHz f = 10 GHz 0.165 0.34 0.20 0.40 dB Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 2. For test procedure see application note AND8307/D. 3. ANSI/ESD STM5.5.1 − Electrostatic Discharge Sensitivity Testing using Transmission Line Pulse (TLP) Model. TLP conditions: Z0 = 50 W, tp = 200 ns, tr = 4 ns, averaging window; t1 = 170 ns to t2 = 190 ns. Figure 1. IEC61000−4−2 + 8 kV Contact ESD Clamping Voltage Figure 2. IEC61000−4−2 − 8 kV Contact ESD Clamping Voltage TIME (ns) TIME (ns) 150 125 100 75 50 25 0 −25 −10 0 10 20 40 50 70 80 125 100 75 150 50 25 0 −25 30 60 90 100 −100 −90 −80 −70 −50 −40 −20 −10 −60 −30 0 10 |
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