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ADA4941-1YRZ-R7 Arkusz danych(PDF) 6 Page - Analog Devices |
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ADA4941-1YRZ-R7 Arkusz danych(HTML) 6 Page - Analog Devices |
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6 / 23 page ![]() ADA4941-1 Data Sheet Rev. D | Page 6 of 23 ABSOLUTE MAXIMUM RATINGS Table 4. Parameter Rating Supply Voltage 12 V Power Dissipation See Figure 3 Storage Temperature Range −65°C to +125°C Operating Temperature Range −40°C to +85°C Lead Temperature (Soldering 10 sec) 300°C Junction Temperature 150°C Stresses at or abovethoselisted under AbsoluteMaximum Ratings may cause permanent damageto the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditionsfor extended periods may affect product reliability. THERMAL RESISTANCE θJA is specified for the worst-caseconditions, that is, θJA is specified for a device soldered in the circuit board with its exposed paddle soldered to a pad (if applicable)on the PCB surface that is thermally connected to a copperplane,with zero airflow. Table 5. Thermal Resistance Package Type θJA θJC Unit 8-Lead SOIC on 4-Layer Board 126 28 °C/W 8-Lead LFCSP with EP on 4-Layer Board 83 19 °C/W MAXIMUM POWER DISSIPATION The maximum safepower dissipation in the ADA4941-1 package is limited by the associated rise in junction temperature (TJ) on the die. At approximately 150°C, which is the glass transition temperature, the plasticchanges its properties. Even temporarily exceeding this temperaturelimit can change the stresses thatthe package exerts on the die, permanently shifting the parametricperformanceof the ADA4941-1. Exceeding a junction temperatureof 150°C for an extended period can result in changes in the silicon devices potentially causing failure. The power dissipated in the package (PD)is the sum of the quiescent powerdissipation and the power dissipated in the package due to the load drive for all outputs. The quiescent power is the voltage between the supply pins (VS)times the quiescent current (IS). The power dissipated due to the load drive depends upon the particular application. For each output, the power due to load drive is calculated by multiplying the load current by the associated voltagedropacrossthe device. The power dissipated due to all of the loads is equal to the sum of the power dissipation dueto each individual load. RMS voltages and currents must be usedin these calculations. Airflow increases heat dissipation, effectively reducing θJA. In addition, more metal directly in contact with the package leads from metal traces, through holes, ground, and power planes reduces the θJA. The exposed paddle on the undersideof the package must be solderedto a pad on the PCB surface thatis thermally connectedtoa copperplanetoachievethespecified θJA. Figure 3 shows the maximum safe power dissipation in the packages vs. the ambient temperaturefor the 8-lead SOIC (126°C/W) and for the 8-lead LFCSP (83°C/W)on a JEDEC standard 4-layer board. TheLFCSP must haveits underside paddle soldered to a pad that is thermally connectedto a PCB plane. θJA values are approximations. 2.5 0 –40 120 AMBIENT TEMPERATURE (°C) 2.0 1.5 1.0 0.5 –20 0 20 40 60 80 100 LFCSP SOIC Figure 3. MaximumPower Dissipation vs. Temperature for a 4-Layer Board ESD CAUTION |
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