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Zakładka z wyszukiwarką danych komponentów |
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Zakładka z wyszukiwarką danych komponentów |
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LC121 Arkusz danych(PDF) 5 Page - Seoul Semiconductor |
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LC121 Arkusz danych(HTML) 5 Page - Seoul Semiconductor |
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5 / 14 page  -5- SEOUL SEMICONDUCTOR CO., LTD. 148-29, Kasan-Dong, Keumchun-Gu, Seoul, Korea TEL : 82-2-3281-6269 FAX : 82-2-857-5430 <060712> Rev. 0.1 LR770D 5. RELIABILITY TESTS 0/22 1 time 1kV, 1.5kΩ ; 100pF ESD (Human Body Model) 0/50 100cycles T a = -50ºC (30min) ~ 105º (30min) (Transfer time : 5sec, 1Cycle = 1hr) Thermal Shock 0/22 100hrs T a = 85ºC, RH = 85% I F = 15mA Temperature Humidity Operating 0/22 1000hrs T a = 85ºC, RH = 85% Temperature Humidity Storage 0/22 1000hrs T a = -50ºC Low Temperature Storage 0/22 1000hrs T a = 105ºC High Temperature Storage 0/22 0/22 0/22 0/22 Failures 1 time T s = 255 ± 5ºC, t = 10sec Resistance to soldering Heat 1000hrs T a = 85ºC, IF = 15mA High Temperature Operating 1000hrs T a = -30ºC, IF = 20mA Low Temperature Operating 1000hrs T a = RT, IF = 30mA Life Test Note Condition Item < Judging Criteria For Reliability Tests > LSL 2 X 0.7 I V USL X 2.0 I R USL 1 X 1.2 V F Notes : 1. USL : Upper Standard Level 2. LSL : Lower Standard Level. |
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