RL1632R-R100-F datasheet(18/22 Pages) ONSEMI

18 / 22 page

NCV78514

www.onsemi.com

Application level EMC performance will depend on the

use of the IC (ASIC) component in an application

environment:

 The influence of the application environment is typically

caused by or related to (but not limited to) the board

design, values and tolerances of external components,

presence of external non−linear elements, size, housing,

wire harness and the variations of all these over different

applications.



For example, EMC signals disturbing directly within

the signal band of normal operation cannot be

distinguished by the IC from normal operating signals.

 Therefore, onsemi cannot take responsibility on

application level EMC testing, application EMC

performances or application solutions for EMC.

 onsemi is willing to cooperate with the customer to find

root causes for application level EMC issues, if the

necessary information is provided to document that a

potential root−cause for application level EMC issues

may be in the ASIC. A potential correction in the ASIC

itself for an application level EMC issue (if feasible) will

need to follow an agreed change procedure.

Remark: please refer to the application schematic for

recommended components.

RL1632R-R100-F Arkusz danych(PDF) 18 Page - ON Semiconductor