LIS331DL datasheet(9/38 Pages) STMICROELECTRONICS

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LIS331DL

Mechanical and electrical specifications

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Mechanical and electrical specifications

2.1

Mechanical characteristics

Table 2.

Mechanical characteristics (1) (2)

Symbol

Parameter

Test conditions

Min.

Typ.(3)

Max.

Unit

Measurement range(4)

FS bit set to 0

±2.0

±2.3

FS bit set to 1

±8.0

±9.2

Sensitivity

FS bit set to 0

mg/digit

FS bit set to 1

TCSO

Sensitivity change vs

temperature

FS bit set to 0

±0.01

%/°C

TyOff

Typical zero-g level offset

accuracy(5),(6)

FS bit set to 0

±40

FS bit set to 1

±60

TCOff

Zero-g level change vs

temperature

Max delta from 25°C

±0.5

mg/°C

Vst

Self test output

change(7),(8),(9)

FS bit set to 0

STP bit used

X axis

-11

LSb

FS bit set to 0

STP bit used

Y axis

LSb

FS bit set to 0

STP bit used

Z axis

-11

LSb

System bandwidth(10)

ODR/2

Top

Operating temperature range

-40

+85

°C

Product weight

mgram

All the parameters are specified @ Vdd= 2.5 V, T = 25°C unless otherwise noted

The product is factory calibrated at 2.5V. The operational power supply range is from 3.0V to 3.6V.

Typical specifications are not guaranteed

Verified by wafer level test and measurement of initial offset and sensitivity

Typical zero-g level offset value after MSL3 preconditioning

Offset can be eliminated by enabling the built-in high pass filter

If STM bit is used values change in sign for all axes

Self Test output changes with the power supply. Self test “output change” is defined as OUTPUT[LSb](Self-test bit on ctrl_reg1=1)

-OUTPUT[LSb](Self-test bit on ctrl_reg1=0). 1LSb=4.6g/256 at 8bit representation, ±2.3g Full-Scale

Output data reach 99% of final value after 3/ODR when enabling Self-Test mode due to device filtering

10. ODR is output data rate. Refer to table 3 for specifications

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