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SC4611ITSTRT Arkusz danych(PDF) 2 Page - Semtech Corporation |
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SC4611ITSTRT Arkusz danych(HTML) 2 Page - Semtech Corporation |
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2 / 11 page ![]() 2 2004 Semtech Corp. www.semtech.com SC4611 POWER MANAGEMENT Absolute Maximum Ratings Electrical Characteristics r e t e m a r a Pl o b m y Ss n o i t i d n o C t s e Tn i Mp y Tx a Mt i n U y l p p u S r e w o P C C V AC C V AV 5 . 5 > N I V5 . 46 5 . 6V C C V PC C V PV 5 . 5 > N I V5 . 46 5 . 6V t n e r r u C g n i t a r e p O I Y L P P U S H D G n o d a o l o N s n i p L D G d n a 70 1A m t n e r r u C t n e c s e i u Q I I U Q V 0 = H S / S S4 6 A m t u o k c o L e g a t l o v r e d n U d l o h s e r h T t r a t S V O L V U g n i s i R C C V A0 . 42 . 44 . 4V s i s e r e t s y H O L V U 6 1 . 0V n w o D t u h S / t r a t S t f o S t n e r r u C e g r a h C I C S S 47 0 1A µ t n e r r u C e g r a h c s i D I D S S 5 . 0A m e g a tl o V d l o h s e r h T e l b a s i D 5 . 0V n w o D t u h S o t w o L e l b a s i D ) 1 ( 0 5S n r e t e m a r a Pl o b m y Sm u m i x a Ms t i n U D N G P o t T S BV X A M T S B 7 3V D N G P o t I D B d n a N I VV X A M N I 0 3V D N G P o t C C V A , C C V PC C V A X A M 7V D N G A o t D N G P 3 . 0 ±V H P o t T S B 7 o t 3 . 0 -V D N G P o t L D G , H P o t H D GV X A M H D G V , X A M L D G 3 . 0 + C C V PV D N G A o t s n i P r e h t O ll A 3 . 0 + C C V AV t n e r r u C k n i S r o e c r u o S L D G , H D GI X A M H D G I , X A M L D G 2A e g n a R e r u t a r e p m e T e g a r o t ST X A M G T S 0 5 1 + o t 0 6 -C ° e r u t a r e p m e T n o it c n u JT X A M J 5 2 1 + o t 0 4 -C ° . c e S 0 1 ) g n ir e d l o S ( e r u t a r e p m e T d a e L 0 6 2C ° Unless specified: T A = TJ = -40 to +85°C, Vin = 12V, PVCC = AVCC = 6V, Fsw = 625 kHz, SS/SH = 5V Exceeding the specifications below may result in permanent damage to the device, or device malfunction. Operation outside of the parameters specified in the Electrical Characteristics section is not implied. Exposure to Absolute Maximum rated conditions for extended periods of time may affect device reliability. |
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