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APM32E103CEU6-R Arkusz danych(PDF) 57 Page - Geehy Semiconductor Co., Ltd. |
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APM32E103CEU6-R Arkusz danych(HTML) 57 Page - Geehy Semiconductor Co., Ltd. |
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57 / 79 page ![]() www.g eeh y.co m Pag e 56 Avg_Slope(1) Average slope (VDD = 3.3V, TA = -40~105°C) 4.1 4.2 4.5 mV/ºC V25 Voltage at 25ºC (VDD =2.4-3.6V) 1.38 1.41 1.44 V tSTART(2) Setup Time 4 10 μs TS_temp(2) (3) ADC sampling Time when reading the temperature 17.1 μs (1) Data is guaranteed by analysis on features, and is not tested in production. (2) Data is guaranteed from design, and is not tested in production. (3) The shortest sampling Time can be determined by the application through multiple iterations. Table 2. Temperature Sensor Features Symbol Parameters Minimum Value Typical Value Maximum Value Unit Avg_Slope(1) Average slope (VDD = 3.3V, TA = -40~105°C) 4.1 4.2 4.5 mV/ºC V25 Voltage at 25ºC (VDD =2.4-3.6V) 1.38 1.41 1.44 V tSTART(2) Setup Time 4 10 μs TS_temp(2) (3) ADC sampling Time when reading the temperature 17.1 μs (4) Data is guaranteed by analysis on features, and is not tested in production. (5) Data is guaranteed from design, and is not tested in production. (6) The shortest sampling Time can be determined by the application through multiple iterations. Table 3. Temperature Sensor Features Symbol Parameters Minimum Value Typical Value Maximum Value Unit Avg_Slope(1) Average slope (VDD = 3.3V, TA = -40~105°C) 4.1 4.2 4.5 mV/ºC V25 Voltage at 25ºC (VDD =2.4-3.6V) 1.38 1.41 1.44 V tSTART(2) Setup Time 4 10 μs TS_temp(2) (3) ADC sampling Time when reading the temperature 17.1 μs (7) Data is guaranteed by analysis on features, and is not tested in production. (8) Data is guaranteed from design, and is not tested in production. (9) The shortest sampling Time can be determined by the application through multiple iterations. |
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