74HC_HCT153

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Product data sheet

Rev. 6 — 11 May 2016

9 of 16

NXP Semiconductors

74HC153; 74HCT153

Dual 4-input multiplexer

Measurement points are given in Table 8.

VOL and VOH are typical voltage output levels that occur with the output load.

Fig 7.

Waveforms showing the input (Sn, nE) to output (nY) propagation delays

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Fig 8.

Test circuit for measuring switching times

Table 9.

Test data

Type

Input

Load

Test

VI

tr, tf

CL

74HC153

VCC

6.0 ns

15 pF, 50 pF

tPLH, tPHL

74HCT153

3.0 V

6.0 ns

15 pF, 50 pF

tPLH, tPHL