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Zakładka z wyszukiwarką danych komponentów |
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Zakładka z wyszukiwarką danych komponentów |
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SMP30-200 Arkusz danych(PDF) 4 Page - STMicroelectronics |
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SMP30-200 Arkusz danych(HTML) 4 Page - STMicroelectronics |
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4 / 6 page  SMP30-xxx Series 4/6 TEST CIRCUIT 2 for IH parameter. R -VP V BAT = - 48 V Surge generator D.U.T. This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : n 1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T. 2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs. 3) The D.U.T will come back off-state within 50 ms max. |
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