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M54HC30 Arkusz danych(PDF) 4 Page - STMicroelectronics

Numer części M54HC30
Szczegółowy opis  RAD-HARD 8-INPUT NAND GATE
PDF  8 Pages
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Producent  STMICROELECTRONICS [STMicroelectronics]
Strona internetowa  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

M54HC30 Arkusz danych(HTML) 4 Page - STMicroelectronics

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M54HC30
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DC SPECIFICATIONS
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr =tf =6ns)
CAPACITIVE CHARACTERISTICS
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) =CPD xVCC xfIN +ICC
Symbol
Parameter
Test Condition
Value
Unit
VCC
(V)
TA = 25°C
-40 to 85°C
-55 to 125°C
Min.
Typ.
Max.
Min.
Max.
Min.
Max.
VIH
High Level Input
Voltage
2.0
1.5
1.5
1.5
V
4.5
3.15
3.15
3.15
6.0
4.2
4.2
4.2
VIL
Low Level Input
Voltage
2.0
0.5
0.5
0.5
V
4.5
1.35
1.35
1.35
6.0
1.8
1.8
1.8
VOH
High Level Output
Voltage
2.0
IO=-20 µA
1.9
2.0
1.9
1.9
V
4.5
IO=-20 µA
4.4
4.5
4.4
4.4
6.0
IO=-20 µA
5.9
6.0
5.9
5.9
4.5
IO=-4.0 mA
4.18
4.31
4.13
4.10
6.0
IO=-5.2 mA
5.68
5.8
5.63
5.60
VOL
Low Level Output
Voltage
2.0
IO=20 µA
0.0
0.1
0.1
0.1
V
4.5
IO=20 µA
0.0
0.1
0.1
0.1
6.0
IO=20 µA
0.0
0.1
0.1
0.1
4.5
IO=4.0 mA
0.17
0.26
0.33
0.40
6.0
IO=5.2 mA
0.18
0.26
0.33
0.40
II
Input Leakage
Current
6.0
VI =VCC or GND
± 0.1
± 1
± 1
µA
ICC
Quiescent Supply
Current
6.0
VI =VCC or GND
110
20
µA
Symbol
Parameter
Test Condition
Value
Unit
VCC
(V)
TA = 25°C
-40 to 85°C
-55 to 125°C
Min.
Typ.
Max.
Min.
Max.
Min.
Max.
tTLH tTHL Output Transition
Time
2.0
30
75
95
110
ns
4.5
8
15
19
22
6.0
7
13
16
19
tPLH tPHL Propagation Delay
Time
2.0
45
115
145
170
ns
4.5
15
23
29
34
6.0
13
20
25
29
Symbol
Parameter
Test Condition
Value
Unit
VCC
(V)
TA = 25°C
-40 to 85°C
-55 to 125°C
Min.
Typ.
Max.
Min.
Max.
Min.
Max.
CIN
Input Capacitance
5.0
5
10
10
10
pF
CPD
Power Dissipation
Capacitance (note
1)
5.0
20
pF



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