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HAF2014 Arkusz danych(PDF) 5 Page - Renesas Technology Corp |
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HAF2014 Arkusz danych(HTML) 5 Page - Renesas Technology Corp |
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5 / 8 page ![]() HAF2014 Rev.3.00 Apr 27, 2006 page 5 of 7 0.10 –40 0 40 80 120 160 Case Temperature Tc (°C) 0 0.02 0.04 0.06 0.08 Static Drain to Source on State Resistance vs. Temperature Pulse Test 10 V VGS = 4 V ID = 20 A ID = 20 A 5 A, 10 A 5 A, 10 A Forward Transfer Admittance vs. Drain Current Drain Current ID (A) 100 50 10 20 5 1 2 0.5 1 2 5 10 20 50 Tc = –25°C 75°C VDS = 10 V Pulse Test 25°C Reverse Drain Current IDR (A) Body-Drain Diode Reverse Recovery Time 0.5 1 2 5 10 20 50 1000 500 200 50 100 20 10 di / dt = 50 A / µs VGS = 0, Ta = 25°C 0 10 20 304050 Drain to Source Voltage VDS (V) Typical Capacitance vs. Drain to Source Voltage 10000 3000 1000 300 100 30 10 Coss VGS = 0 f = 1 MHz 50 0 Source to Drain Voltage VSD (V) 0 10 20 30 40 Reverse Drain Current vs. Source to Drain Voltage 0.4 0.8 1.2 1.6 2.0 VGS = 5 V 1000 500 200 50 100 20 10 12 10 520 50 0.5 Drain Current ID (A) Switching Characteristics Pulse Test tf tr td(off) td(on) 0 V VGS = 5 V, VDD = 30 V PW = 300 µs, duty ≤ 1 % |
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