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ADATE304BBCZ Arkusz danych(PDF) 19 Page - Analog Devices

Numer części ADATE304BBCZ
Szczegółowy opis  200 MHz Dual Integrated DCL with Level Setting DACs, Per Pin PMU, and Per Chip VHH
PDF  52 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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ADATE304BBCZ Arkusz danych(HTML) 19 Page - Analog Devices

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ADATE304
Rev. 0 | Page 19 of 52
ABSOLUTE MAXIMUM RATINGS
THERMAL RESISTANCE
Table 14.
Parameter
Rating
Supply Voltages
Positive Supply Voltage (VDD to GND)
−0.5 V to +11.5 V
Positive VCC Supply Voltage (VCC to GND)
−0.5 V to +4.0 V
Negative Supply Voltage (VSS to GND)
−6.25 V to +0.5 V
Supply Voltage Difference (VDD to VSS)
−1.0 V to +16.5 V
Reference Ground (DUTGND to GND)
−0.5 V to +0.5 V
AGND to DGND
−0.5 V to +0.5 V
VPLUS Supply Voltage (VPLUS to GND)
−0.5 V to +17.5 V
Input Voltages
Input Common-Mode Voltage
VSS to VDD
Short-Circuit Voltage1
−3.0 V to +8.0 V
High Speed Input Voltage2
0.0 V to VCC
High Speed Differential Input Voltage3
0.0 V to VCC
VREF
−0.5 V to +5.5 V
DUTx I/O Pin Current
DCL Maximum Short-Circuit Current4
±140 mA
Temperature
Operating Temperature, Junction
125°C
Storage Temperature Range
−65°C to +150°C
Table 15. Thermal Resistance
Package Type
θJA
θJC
84-Ball CSP_BGA
31.1
0.51
EXPLANATION OF TEST LEVELS
D
Definition
S
Design verification simulation
P
100% production tested
PF
Functionally checked during production test
CT
Characterized on tester
CB
Characterized on bench
ESD CAUTION
1 RL = 0 Ω, VDUT continuous short-circuit condition (VH, VL, VT, high-Z, VCOM,
clamp modes).
2 DATAxP, DATAxN, RCVxP, RCVxN, under source RL = 0 Ω.
3 DATAxP to DATAxN, RCVxP, RCVxN.
4 RL = 0 Ω, VDUTx = –3 V to +8 V; DCL current limit. Continuous short-circuit
condition. ADATE304 must current limit and survive continuous short circuit.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.



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