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APT7F100S Arkusz danych(PDF) 2 Page - Microsemi Corporation

Numer części APT7F100S
Szczegółowy opis  N-Channel FREDFET
PDF  4 Pages
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Producent  MICROSEMI [Microsemi Corporation]
Strona internetowa  http://www.microsemi.com
Logo MICROSEMI - Microsemi Corporation

APT7F100S Arkusz danych(HTML) 2 Page - Microsemi Corporation

  APT7F100S Datasheet HTML 1Page - Microsemi Corporation APT7F100S Datasheet HTML 2Page - Microsemi Corporation APT7F100S Datasheet HTML 3Page - Microsemi Corporation APT7F100S Datasheet HTML 4Page - Microsemi Corporation  
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Static Characteristics
TJ=25°Cunlessotherwisespecified
Dynamic Characteristics
TJ=25°Cunlessotherwisespecified
Source-Drain Diode Characteristics
1 Repetitive Rating: Pulse width and case temperature limited by maximum junction temperature.
2 Starting at T
J = 25°C, L = 53mH, RG = 25Ω, IAS = 4A.
3 Pulse test: Pulse Width < 380µs, duty cycle < 2%.
4 C
o(cr) is defined as a fixed capacitance with the same stored charge as COSS with VDS = 67% of V(BR)DSS.
5 C
o(er) is defined as a fixed capacitance with the same stored energy as COSS with VDS = 67% of V(BR)DSS. To calculate Co(er) for any value of
V
DS less than V(BR)DSS, use this equation: Co(er) = -3.43E-8/VDS^2 + 1.44E-8/VDS + 5.38E-11.
6 R
G is external gate resistance, not including internal gate resistance or gate driver impedance. (MIC4452)
Microsemireservestherighttochange,withoutnotice,thespecificationsandinformationcontainedherein.
G
D
S
Unit
V
V/°C
V
mV/°C
µA
nA
Unit
S
pF
nC
ns
Unit
A
V
ns
µC
A
V/ns
Min
Typ
Max
1000
1.15
1.76
2.0
2.5
4
5
-10
250
1000
±100
Min
Typ
Max
7
27
1.3
133
152
209
251
.56
1.2
7
9
25
Min
Typ
Max
7.5
1800
25
158
65
33
58
10
27
24
26
77
22
Test Conditions
VGS = 0V, ID = 250µA
Reference to 25°C, ID = 250µA
VGS = 10V, ID = 4A
VGS = VDS, ID = 0.5mA
VDS = 1000V TJ = 25°C
VGS = 0V
TJ = 125°C
VGS = ±30V
Test Conditions
MOSFET symbol
showing the
integral reverse p-n
junction diode
(body diode)
ISD = 4A, TJ = 25°C, VGS = 0V
TJ = 25°C
TJ = 125°C
ISD = 4A 3
TJ = 25°C
diSD/dt = 100A/µs
TJ = 125°C
VDD = 100V
TJ = 25°C
TJ = 125°C
ISD ≤ 4A, di/dt ≤1000A/µs, VDD = 500V,
TJ = 125°C
Test Conditions
VDS = 50V, ID = 4A
VGS = 0V, VDS = 25V
f = 1MHz
VGS = 0V, VDS = 0V to 670V
VGS = 0 to 10V, ID = 4A,
VDS = 500V
ResistiveSwitching
VDD = 670V, ID = 4A
RG = 10Ω 6 , VGG = 15V
Parameter
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature Coefficient
Drain-Source On Resistance 3
Gate-Source Threshold Voltage
Threshold Voltage Temperature Coefficient
Zero Gate Voltage Drain Current
Gate-Source Leakage Current
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode) 1
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
Peak Recovery dv/dt
Parameter
Forward Transconductance
Input Capacitance
Reverse Transfer Capacitance
Output Capacitance
Effective Output Capacitance, Charge Related
Effective Output Capacitance, Energy Related
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Current Rise Time
Turn-Off Delay Time
Current Fall Time
Symbol
V
BR(DSS)
∆V
BR(DSS)/∆TJ
R
DS(on)
V
GS(th)
∆V
GS(th)/∆TJ
I
DSS
I
GSS
Symbol
I
S
I
SM
V
SD
t
rr
Q
rr
I
rrm
dv/dt
Symbol
g
fs
C
iss
C
rss
C
oss
C
o(cr)
4
C
o(er)
5
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
APT7F100B_S



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