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SPT5240 Arkusz danych(PDF) 3 Page - Cadeka Microcircuits LLC. |
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SPT5240 Arkusz danych(HTML) 3 Page - Cadeka Microcircuits LLC. |
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3 / 10 page ![]() REV. 1 June 2003 3 SPT5240 DATA SHEET TEST LEVEL CODES All electrical characteristics are subject to the following conditions: All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. LEVEL TEST PROCEDURE I 100% production tested at the specified temperature. IV Parameter is guaranteed by design or characterization data. V Parameter is a typical value for information purposes only. Power Supply Requirements Supply Voltage AVDD = DVDD IV 3.0 +3.3 3.6 V Supply Current Sleep Mode AVDD 25MHz Clock V 9.5 mA DVDD 25MHz Clock V 200 µA Power Dissipation 20mA IOUT IV 170 195 215 mW 12mA IOUT V 149 mW Parameter Conditions Test Level Min Typ Max Units Electrical Specifications (Continued) (TA = 25°C, AVDD = 3.3V, DVDD = 3.3V, ƒOUT = 1.27MHz, ƒCLK = 400MHz, Clock Duty Cycle = 50%, IOUT = 20mA, RL = 50Ω; unless otherwise noted) |
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