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SPT7936 Arkusz danych(PDF) 3 Page - Cadeka Microcircuits LLC. |
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SPT7936 Arkusz danych(HTML) 3 Page - Cadeka Microcircuits LLC. |
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3 / 8 page ![]() 3 8/1/00 SPT7936 ELECTRICAL SPECIFICATIONS TA = TMIN-TMAX, VDD1 =VDD2 = 3.3 V, Sampling Rate = 28 MSPS, Differential input signal, 50% duty cycle clock with 2.5 ns rise and fall times, unless otherwise specified. TEST TEST SPT7936 PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS Dynamic Performance Spurious Free Dynamic Range (SFDR) fIN = 5.0 MHz V 67 dB fIN = 10.0 MHz VI 62 64 dB Differential Phase (DP) V 0.08 degrees Differential Gain (DG) V 0.27 % Digital Inputs Logic 0 Voltage (VIL) VI 20% VDD Logic 1 Voltage (VIH) VI 80% VDD Logic 0 Current (IIL) (VI=VSS)VI ±1 µA Logic 1 Current (IIH)(VI=VDD)VI ±1 µA Input Capacitance (CIND) V 1.8 pF Digital Outputs Logic 0 Voltage (VOL) (I = +2 mA) VI 0.2 0.4 V Logic 1 Voltage (VOH) (I = -2 mA) VI 85% VDD 90% VDD V Output Hold Time (tH)V 5 ns Output Delay Time (tD)V 8 ns Switching Performance Maximum Conversion Rate (fS) VI 28 MSPS Minimum Conversion Rate IV 1 MSPS Pipeline Delay (See Timing Diagram) IV 8.0 Clocks Aperture Jitter σAP V10 ps Aperture Delay tAP V2 ns Power Supply Supply Voltage VDD IV 3.0 3.3 3.6 V Supply Current IDD ext ref VI 75 87 mA int ref VI 79 91 mA Power Dissipation PD ext ref VI 248 288 mW int ref VI 260 300 mW Sleep Mode Current ext ref VI 8 9 mA int ref VI 11 12 mA Sleep Mode Power Dissipation ext ref VI 25 29 mW int ref VI 36 40 mW Power Supply Rejection Ratio (PSRR) V 52 dB TEST LEVEL I II III IV V VI TEST PROCEDURE 100% production tested at the specified temperature. 100% production tested at TA = +25 °C, and sample tested at the specified temperatures. QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design and characterization data. Parameter is a typical value for information purposes only. 100% production tested at TA = +25 °C. Parameter is guaranteed over specified temperature range. TEST LEVEL CODES All electrical characteristics are subject to the following conditions: All parameters having min/ max specifications are guaranteed. The Test Level column indicates the specific device test- ing actually performed during production and Quality Assurance inspection. Any blank sec- tion in the data column indicates that the speci- fication is not tested at the specified condition. |
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