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MCP6286 Arkusz danych(PDF) 5 Page - Microchip Technology |
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MCP6286 Arkusz danych(HTML) 5 Page - Microchip Technology |
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5 / 28 page ![]() © 2009 Microchip Technology Inc. DS22196A-page 5 MCP6286 1.2 Test Circuits The circuit used for most DC and AC tests is shown in Figure 1-1. It independently sets VCM and VOUT; see Equation 1-1. The circuit’s common mode voltage is (VP +VM)/2, not VCM. VOST includes VOS plus the effects of temperature, CMRR, PSRR and AOL. EQUATION 1-1: FIGURE 1-1: AC and DC Test Circuit for Most Specifications. G DM R F RG ⁄ = V CM V P 11 GN ⁄ – () V REF 1 GN ⁄ () + = V OUT V REF V P V M – ()G DM V OSTGN ++ = Where: GDM = Differential Mode Gain (V/V) GN = Noise Gain (V/V) VCM = Op Amp’s Common Mode Input Voltage (V) VOST = Op Amp’s Total Input Offset Voltage (mV) V OST V IN– V IN+ – = G N 1 G DM + = VDD MCP6286 RG RF VOUT VM CB2 CL RL VL CB1 100 k Ω 100 k Ω RG RF VREF = VDD/2 VP 100 k Ω 100 k Ω 60 pF 10 k Ω 1µF 100 nF VIN– VIN+ CF 6.8 pF CF 6.8 pF |
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