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WM2619CDT Arkusz danych(PDF) 6 Page - Wolfson Microelectronics plc |
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WM2619CDT Arkusz danych(HTML) 6 Page - Wolfson Microelectronics plc |
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6 / 9 page ![]() WM2619 Production Data WOLFSON MICROELECTRONICS LTD Production Data Rev 1.0 June 1999 6 SERIAL INTERFACE NCS NWE NLDAC D [0:11] Data X X t SUCSWE t SUDWE t HD t WWE t WLD t SUWELD Figure 1 Timing Diagram Test Conditions: RL = 10k Ω, C L = 100pF. VDD = 5V ±± 10%, V REF = 2.048V and VDD = 3V ±± 10%, V REF = 1.024V over recommended operating free-air temperature range (unless noted otherwise) SYMBOL TEST CONDITIONS MIN TYP MAX UNIT tSUCSWE Setup time NCS low before positive NWE edge 13 ns tSUDWE Setup time data ready before positive NWE edge 9 ns THD Data hold after positive NWE edge 0 ns tSUWELD Setup time NWE high before NLDAC low 0 ns tWWE High pulse width of NWE 10 ns tWLD Low pulse width of NLDAC 10 ns |
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