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S3P9404 Arkusz danych(PDF) 13 Page - Samsung semiconductor |
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S3P9404 Arkusz danych(HTML) 13 Page - Samsung semiconductor |
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13 / 32 page ![]() S3C9404/P9404/C9414/P9414 ELECTRICAL DATA 13-5 Table 13-4. Oscillator Characteristics (TA = – 40°C to + 85°C) Oscillator Clock Circuit Test Condition Min Typ Max Unit Main crystal or ceramic C2 XIN XOUT C1 V DD = 4.5 to 5.5 V V DD = 2.7 to 4.5 V 1 1 – – 10 8 MHz External clock XIN XOUT V DD = 4.5 to 5.5 V V DD = 2.7 to 4.5 V 1 1 – – 10 8 RC oscillator R XIN XOUT V DD = 4.75 to 5.25 V R = 8.2K – 4 (P1.3/ CLO) – Table 13-5. Oscillation Stabilization Time (TA = – 40°C to + 85°C, VDD = 2.7 V to 5.5 V) Oscillator Test Condition Min Typ Max Unit Main crystal f OSC > 1.0 MHz – – 20 ms Main ceramic Oscillation stabilization occurs when V DD is equal to the minimum oscillator voltage range. – – 10 External clock (main system) X IN input high and low width (tXH, tXL) 25 – 500 ns Oscillator stabilization t WAIT when released by a reset (1) – 216/f OSC – ms wait time t WAIT when released by an interrupt (2) – – – NOTES: 1. fOSC is the oscillator frequency. 2. The duration of the oscillator stabilization wait time, tWAIT, when it is released by an interrupt is determined by the settings in the basic timer control register, BTCON. |
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