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TLE6389 Arkusz danych(PDF) 8 Page - Infineon Technologies AG |
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TLE6389 Arkusz danych(HTML) 8 Page - Infineon Technologies AG |
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8 / 38 page ![]() TLE 6389 Datasheet Rev. 2.1 8 2007-08-13 Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are not designed for continuous repetitive operation. Temperatures 2.33 Junction temperature Tj -40 150 °C – 2.34 Storage temperature Tstg -50 150 °C – 1) ESD susceptibility HBM according to EIA/JESD 22-A 114B. 2) ESD susceptibility CDM according to JESD 22-C101. 2 Absolute Maximum Ratings (cont’d) Item Parameter Symbol Limit Values Unit Remarks min. max. |
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