HCS515 datasheet(23/38 Pages) MICROCHIP

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DS40183E-page 23

HCS515

9.0

ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings†

Ambient temperature under bias............................................................................................................ -40°C to +125°C

Storage temperature .............................................................................................................................. -65 °C to +150°C

Voltage on any pin with respect to VSS (except VDD)......................................................................... -0.6V to VDD +0.6V

Voltage on VDD with respect to Vss ..................................................................................................................0 to +7.0V

Total power dissipation (Note) .............................................................................................................................700 mW

Maximum current out of VSS pin ...........................................................................................................................200 mA

Maximum current into VDD pin ..............................................................................................................................150 mA

Input clamp current, IIK (VI < 0 or VI > VDD) .........................................................................................................± 20 mA

Output clamp current, IOK (VO < 0 or VO >VDD) ..................................................................................................± 20 mA

Maximum output current sunk by any I/O pin..........................................................................................................25 mA

Maximum output current sourced by any I/O pin ....................................................................................................25 mA

Note:

Power dissipation is calculated as follows: PDIS = VDD x {IDD -

∑IOH} + ∑{(VDD–VOH) x IOH} + ∑(VOL x IOL)

† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the

device. This is a stress rating only and functional operation of the device at those or any other condi-

tions above those indicated in the operation listings of this specification is not implied. Exposure to

maximum rating conditions for extended periods may affect device reliability.

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