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Zakładka z wyszukiwarką danych komponentów |
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Zakładka z wyszukiwarką danych komponentów |
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MLZ2012A3R3W Arkusz danych(PDF) 49 Page - Texas Instruments |
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MLZ2012A3R3W Arkusz danych(HTML) 49 Page - Texas Instruments |
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49 / 68 page  www.ti.com Test Options on the EVM 8.5 Internally Generated Test Signal and Other Multiplexer Inputs ADS1299 internally generates a test signal that can be used for signal integrity check. Also the multiplexer provides options to measure supply voltage, temperature, etc. Details of these inputs can be found in Section 5.3. 8.6 Arbitrary Input Signal Any input signal can be fed to the device on connector J6 as described in Section 4.6. Figure 58 shows the results obtained when a single ended sinusoidal signal is applied to AIN1 by following the steps described in Section 4.6.2. Figure 58. Scope Tab with Sinusoidal Inputs on AIN1 49 SLAU443 – May 2012 EEG Front-End Performance Demonstration Kit Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated |
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