ADR293

REV. 0

–3–

WAFER TEST LIMITS

Parameter

Symbol

Conditions

Limits

Units

INITIAL ACCURACY

4.990/5.010

V

LINE REGULATION

∆V

∆V

IN

150

ppm/V

LOAD REGULATION

∆V

∆I

LOAD

0 mA to 5 mA

150

ppm/mA

SUPPLY CURRENT

No load

15

µA

NOTES

Electrical tests are performed as wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed

for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.

Specifications subject to change without notice.

DICE CHARACTERISTICS

Die Size 0.074

0.052 inch, 3848 sq. mils

(1.88

1.32 mm, 2.48 sq. mm)

Transistor Count: 52

25 C unless otherwise noted)

4

3

2

1

V

OUT(SENSE)

V

OUT(FORCE)

GND