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STM32F102xB Arkusz danych(PDF) 64 Page - STMicroelectronics |
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STM32F102xB Arkusz danych(HTML) 64 Page - STMicroelectronics |
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64 / 76 page ![]() Electrical characteristics STM32F102x8, STM32F102xB 64/76 Doc ID 15056 Rev 4 Note: ADC accuracy vs. negative injection current: Injecting a negative current on any analog input pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject negative currents. Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 5.3.13 does not affect the ADC accuracy. Table 46. RAIN max for fADC = 12 MHz (1) 1. Data guaranteed by design, not tested in production. Ts (cycles) tS (µs) RAIN max (kΩ) 1.5 0.13 0.4 7.5 0.63 5.9 13.5 1.13 11.4 28.5 2.38 25.2 41.5 3.46 37.2 55.5 4.63 50 71.5 5.96 NA 239.5 19.96 NA Table 47. ADC accuracy - limited test conditions(1) 1. ADC DC accuracy values are measured after internal calibration. Symbol Parameter Test conditions Typ Max(2) 2. Based on characterization, not tested in production. Unit ET Total unadjusted error fPCLK2 = 48 MHz, fADC = 12 MHz, RAIN < 10 kΩ, VDDA = 3 V to 3.6 V TA = 25 °C Measurements made after ADC calibration ±1.3 ±2 LSB EO Offset error ±1 ±1.5 EG Gain error ±0.5 ±1.5 ED Differential linearity error ±0.7 ±1 EL Integral linearity error ±0.8 ±1.5 Table 48. ADC accuracy(1) (2) 1. ADC DC accuracy values are measured after internal calibration. 2. Better performance could be achieved in restricted VDD, frequency and temperature ranges. Symbol Parameter Test conditions Typ Max(3) 3. Based on characterization, not tested in production. Unit ET Total unadjusted error fPCLK2 = 48 MHz, fADC = 12 MHz, RAIN < 10 kΩ, VDDA = 2.4 V to 3.6 V Measurements made after ADC calibration ±2 ±5 LSB EO Offset error ±1.5 ±2.5 EG Gain error ±1.5 ±3 ED Differential linearity error ±1 ±2 EL Integral linearity error ±1.5 ±3 |
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