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SSWM81EB0 Arkusz danych(PDF) 9 Page - Seoul Semiconductor

Numer części SSWM81EB0
Szczegółowy opis  Side View LEd Of Reflector Type
PDF  18 Pages
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Producent  SEOUL [Seoul Semiconductor]
Strona internetowa  http://www.seoulsemicon.com
Logo SEOUL - Seoul Semiconductor

SSWM81EB0 Arkusz danych(HTML) 9 Page - Seoul Semiconductor

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APCPCWM_4828539:WP_0000001WP_0000001
Rev. 00
Rev. 00
October, 2012
October, 2012
www.acrich.com
www.acrich.com
Document No. : QP-7-07-18 (Rev.00) 공통_을
[9 /18]
[9 /18]
Item
Symbol
Condition
Criteria for Judgement
MIN
MAX
Forward Voltage
V
F
I
F =20mA
-
I.V. *1 × 1.2
Reverse Current
I
R
V
R=5V
-
U.S.L.*2 × 2.0
Luminous Intensity
I
V
I
F =20mA
I.V. × 0.7
-
Note :
*1 I.V. : Initial Value
*2 U.S.L. : Upper Standard Level
* Criteria for Judging the Damage
5. Reliability Test
* TEST ITEMS AND RESULTS
Item
Reference
Test Condition
Duration
/ Cycle
Number of
Damage
Life Test
-
T
a = 25
℃, I
F = 20mA
1,000
Hours
0/20
High Temperature
Life Test
-
T
a = 85
℃, I
F = 5mA
1,000
Hours
0/20
Low Temperature
Life Test
-
T
a = -30
℃, I
F = 20mA
1,000
Hours
0/20
High Humidity
Heat Life Test
JEITA ED-4701
100 102
T
a = 60
℃, RH = 90%, I
F = 20mA
500
Hours
0/20
High Temperature
Storage
JEITA ED-4701
200 201
T
a = 100
℃
1,000
Hours
0/20
Low Temperature
Storage
JEITA ED-4701
200 202
T
a = -40
℃
1,000
Hours
0/20
Temperature Cycle
JEITA ED-4701
100 105
-40℃ ~ 25℃ ~ 100℃ ~ 25℃
(30min) (5min) (30min) (5min)
100 cycle
0/50



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