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SC212KSIT Arkusz danych(PDF) 7 Page - SEC Electronics Inc.

Numer części SC212KSIT
Szczegółowy opis  120 kHz Bandwidth, High Voltage Isolation Current Sensor with Integrated Overcurrent Detection
PDF  13 Pages
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Producent  SECELECTRONICS [SEC Electronics Inc.]
Strona internetowa  http://www.secsemi.com
Logo SECELECTRONICS - SEC Electronics Inc.

SC212KSIT Arkusz danych(HTML) 7 Page - SEC Electronics Inc.

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SC212KSIT
120 kHz Bandwidth, High Voltage Isolation
Current Sensor with Integrated Overcurrent Detection
7/13
1. Devices are programmed for maximum accuracy at VCC = 5 V. The device contains ratiometry circuits that accurately alter
the 0 A Output Voltage and Sensitivity level of the device in proportion to the applied VCC level. However, as a result of
minor nonlinearities in the ratiometry circuit, additional output error will result when VCC varies from the VCC level at
which the device was programmed. Customers that plan to operate the device at a VCC level other than the VCC level at
which the device was programmed should contact their local SEC sales representative regarding expected device accuracy
levels
2. Under these bias conditions.
3. RF(INT) forms an RC circuit via the FILTER pin.
4. This parameter can drift by as much as 0.8% over the lifetime of this product.
5. This parameter can drift by as much as 1% over the lifetime of this product.
6. See page 8 on how to set overcurrent fault switch point.
7. Switchpoint can be lower at the expense of switch point accuracy.
8. This error specification does not include the effect of noise. See the INCOMP specification in order to factor in the additional
influence of noise on the fault switch point.
9. Fault Enable Delay is designed to avoid false tripping of an Overcurrent (OC) fault at power-
up. A 15 μs (typical) delay will
always be needed, every time FAULT_EN is raised from low to high, before the device is ready for responding to any
overcurrent event.
10. During power-
up, this delay is 15 μs in order to avoid false tripping of an Overcurrent (OC) fault.



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