2004 Jan 14

6

NXP Semiconductors

Product data sheet

High-speed double diode

BAV74

Fig.7 Reverse recovery voltage test circuit and waveforms.

handbook, full pagewidth

t rr

(1)

I F

t

output signal

t r

t

t p

10%

90%

VR

input signal

V = V

I x R

RF

S

R = 50

S

Ω

IF

D.U.T.

R = 50

i

Ω

SAMPLING

OSCILLOSCOPE

MGA881

Fig.8 Forward recovery voltage test circuit and waveforms.

t r

t

t p

10%

90%

I

input

signal

R = 50

S

Ω

I

R = 50

i

Ω

OSCILLOSCOPE

Ω

1 k

Ω

450

D.U.T.

MGA882

V fr

t

output

signal

V